Profile analysis of X-ray powder diffraction data.
Various strategies have been tested for obtaining integrated intensities from x-ray powder diffractometer data. An asymmetric pseudo-Voigt profile function was used to fit the pattern in the region above 2θ = 35̊ (Cu-Kα radiation). At lower angles where the asymmetry was strongest and the profile f...
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| Language: | en_ZA |
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2013
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| Online Access: | http://hdl.handle.net/10413/9933 |