A novel test method for minimising energy costs in IGBT power cycling studies
Insulated Gate Bipolar Transistors (IGBTs) are popular power electronic switching devices with several advantages. However, they have been known to fail in the field when subjected to significant variations in power dissipation – known as power cycling. In the work presented here, a novel alterna...
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| Format: | Others |
| Language: | en |
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2008
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| Online Access: | http://hdl.handle.net/10539/4614 |