Near field imaging of charge transport in gallium nitride and zinc oxide nanostructures
Approved for public release; distribution is unlimited === A novel technique for imaging minority carrier diffusion in semiconductor nanostructures has been applied to the characterization of GaN and ZnO nanowires and nanobelts. Near field scanning optical microscopy (NSOM) is performed within a sca...
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Monterey, California. Naval Postgraduate School
2012
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| Online Access: | http://hdl.handle.net/10945/5032 |