Charakterizace modelových CeO2 a TiO2 systémů pomocí rastrovací tunelové mikroskopie a mikroskopie atomárních sil
Atomic scale characterization of materials is important for the fundamental understanding of their properties. Here, model systems of industrially relevant cerium and titanium oxides are characterized with the combination of the Scanning Tunneling Microscopy (STM) and Non Contact Atomic Force Micros...
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| Format: | Doctoral Thesis |
| Language: | English |
| Published: |
2014
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| Online Access: | http://www.nusl.cz/ntk/nusl-332287 |