On-chip testing of A/D and D/A converters:static linearity testing without statistically known stimulus
Abstract The static linearity testing of analog-to-digital and digital-to-analog converters (ADCs and DACs) has traditionally required test instruments with higher linearity and resolution than that of the device under test. In this thesis ways to test converters without expensive precision instrum...
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| Format: | Doctoral Thesis |
| Language: | English |
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University of Oulu
2010
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| Online Access: | http://urn.fi/urn:isbn:9789514263064 http://nbn-resolving.de/urn:isbn:9789514263064 |