Detection of Variable Retention Time in DRAM
This thesis investigates a test method to detect the presence of Variable Retention Time (VRT) bits in manufactured DRAM. The VRT bits retention time is modeled as a 2-state random telegraph process that includes miscorrelation between test and use. The VRT defect is particularly sensitive to test a...
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Format: | Others |
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PDXScholar
2014
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Online Access: | https://pdxscholar.library.pdx.edu/open_access_etds/2103 https://pdxscholar.library.pdx.edu/cgi/viewcontent.cgi?article=3103&context=open_access_etds |