Aberration Corrected Photoemission Electron Microscopy with Photonics Applications
Photoemission electron microscopy (PEEM) uses photoelectrons excited from material surfaces by incident photons to probe the interaction of light with surfaces with nanometer-scale resolution. The point resolution of PEEM images is strongly limited by spherical and chromatic aberration. Image aberra...
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| Format: | Others |
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PDXScholar
2015
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| Online Access: | https://pdxscholar.library.pdx.edu/open_access_etds/2192 https://pdxscholar.library.pdx.edu/cgi/viewcontent.cgi?article=3193&context=open_access_etds |