ANALYTICAL METHODS TO PROPAGATE AND DIAGNOSE SINGLE EVENT TRANSIENTS

ANALYTICAL METHODS TO PROPAGATE AND DIAGNOSE SINGLE EVENT TRANSIENTS

Rapidly shrinking technology node and aggressive scaling of voltage have increased the probability of soft errors. In the current deep sub-micron technology, a small inaccuracy in computing the probability of occurrence of a soft error results in an unacceptably large chip failure rate. We propose...

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Bibliographic Details
Main Author: Gangadhar, Sreenivas
Format: Others
Published: OpenSIUC 2012
Subjects:
Diagnosis
Hardening
Probability
Propagation
SET
Test generation
Online Access:https://opensiuc.lib.siu.edu/dissertations/538
https://opensiuc.lib.siu.edu/cgi/viewcontent.cgi?article=1539&context=dissertations

Internet

https://opensiuc.lib.siu.edu/dissertations/538
https://opensiuc.lib.siu.edu/cgi/viewcontent.cgi?article=1539&context=dissertations

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