Methodologies for Test and Diagnosis of Delay Defects in Integrated Circuits
The failure of devices due to timing-related defects is becoming increasingly prominent in the nanometer era, thereby causing quality and reliability concerns. The variations in physical parameters and the increasing influence of environmental factors are the potential sources of such timing-related...
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OpenSIUC
2015
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| Online Access: | https://opensiuc.lib.siu.edu/dissertations/1117 https://opensiuc.lib.siu.edu/cgi/viewcontent.cgi?article=2121&context=dissertations |