Analysis and Mitigation of Multiple Radiation Induced Errors in Modern Circuits
Due to technology scaling, the probability of a high energy radiation particle striking multiple transistors has continued to increase. This, in turn has created a need for new circuit designs that can tolerate multiple simultaneous errors. A common type of error in memory elements is the double nod...
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| Format: | Others |
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OpenSIUC
2016
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| Online Access: | https://opensiuc.lib.siu.edu/dissertations/1325 https://opensiuc.lib.siu.edu/cgi/viewcontent.cgi?article=2329&context=dissertations |