EMERGING MEMORY-BASED DESIGNS AND RESILIENCY TO RADIATION EFFECTS IN ICS
The performance of a modern computing system is improving with technology scaling due to advancements in the modern semiconductor industry. However, the power efficiency along with reliability does not scale linearly with performance efficiency. High leakage and standby power in sub 100 nm technolog...
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| Format: | Others |
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OpenSIUC
2020
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| Online Access: | https://opensiuc.lib.siu.edu/dissertations/1863 https://opensiuc.lib.siu.edu/cgi/viewcontent.cgi?article=2867&context=dissertations |