Reliability-yield allocation for semiconductor integrated circuits: modeling and optimization
This research develops yield and reliability models for fault-tolerant semiconductor integrated circuits and develops optimization algorithms that can be directly applied to these models. Since defects cause failures in microelectronics systems, accurate yield and reliability models considering thes...
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| Format: | Others |
| Language: | en_US |
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Texas A&M University
2005
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| Online Access: | http://hdl.handle.net/1969.1/2777 |