High frequency continuous-time circuits and built-in-self-test using CMOS RMS detector
The expanding wireless market has resulted in complex integrated transceivers that involve RF, analog and mixed-signal circuits, resulting in expensive and complicated testing. The most important challenges that test engineering faces today are (1) providing a fast and accurate fault-diagnosis and p...
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| Format: | Others |
| Language: | en_US |
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Texas A&M University
2007
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| Online Access: | http://hdl.handle.net/1969.1/4746 |