Secondary ion emission from single massive gold cluster impacts
Secondary ion mass spectrometry, SIMS, is one of the most versatile surface analytical techniques. The significant parameter determining the performance of SIMS is the secondary ion yield. Atomic projectiles, traditionally used in SIMS, are an inefficient method to desorb and generate secondary ions...
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| Format: | Others |
| Language: | en_US |
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Texas A&M University
2007
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| Online Access: | http://hdl.handle.net/1969.1/5899 |