Surface spectroscopic characterization of oxide thin films and bimetallic model catalysts

Surface spectroscopic characterization of oxide thin films and bimetallic model catalysts

Oxide thin films and bimetallic model catalysts have been studied using metastable impact electron spectroscopy (MIES), ultraviolet photoelectron spectroscopy (UPS), low energy ion scattering spectroscopy (LEISS), X – ray photoelectron spectroscopy (XPS), low energy electron diffraction (LEED), infr...

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Bibliographic Details
Main Author: Wei, Tao
Other Authors: Goodman, D. Wayne
Format: Others
Language:en_US
Published: 2010
Subjects:
surface science
catalysis
oxide thin film
bimetallic model catalysts
surface defects
vibrational spectroscopy
Online Access:http://hdl.handle.net/1969.1/ETD-TAMU-1058
http://hdl.handle.net/1969.1/ETD-TAMU-1058

Internet

http://hdl.handle.net/1969.1/ETD-TAMU-1058
http://hdl.handle.net/1969.1/ETD-TAMU-1058

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