Concurrent Online Testing for Many Core Systems-on-Chips
Shrinking transistor sizes have introduced new challenges and opportunities for system-on-chip (SoC) design and reliability. Smaller transistors are more susceptible to early lifetime failure and electronic wear-out, greatly reducing their reliable lifetimes. However, smaller transistors will also a...
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| Format: | Others |
| Language: | en_US |
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2012
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| Online Access: | http://hdl.handle.net/1969.1/ETD-TAMU-2010-12-8615 |