Low Cost Power and Supply Noise Estimation and Control in Scan Testing of VLSI Circuits
Test power is an important issue in deep submicron semiconductor testing. Too much power supply noise and too much power dissipation can result in excessive temperature rise, both leading to overkill during delay test. Scan-based test has been widely adopted as one of the most commonly used VLSI tes...
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| Format: | Others |
| Language: | en_US |
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2012
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| Online Access: | http://hdl.handle.net/1969.1/ETD-TAMU-2010-12-8915 |