Design methodologies for built-in testing of integrated RF transceivers with the on-chip loopback technique

Design methodologies for built-in testing of integrated RF transceivers with the on-chip loopback technique

Advances toward increased integration and complexity of radio frequency (RF) andmixed-signal integrated circuits reduce the effectiveness of contemporary testmethodologies and result in a rising cost of testing. The focus in this research is on thecircuit-level implementation of alternative test str...

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Bibliographic Details
Main Author: Onabajo, Marvin Olufemi
Other Authors: Silva-Martinez, Jose
Format: Others
Language:en_US
Published: 2010
Subjects:
Built-in test (BIT)
loopback
offset mixer
RF front-end testing
RF current injection
low-noise amplifier (LNA)
integrated transceiver
Online Access:http://hdl.handle.net/1969.1/ETD-TAMU-2501
http://hdl.handle.net/1969.1/ETD-TAMU-2501

Internet

http://hdl.handle.net/1969.1/ETD-TAMU-2501
http://hdl.handle.net/1969.1/ETD-TAMU-2501

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