Performance analysis of fault-tolerant nanoelectronic memories
Performance growth in microelectronics, as described by Moore’s law, is steadily approaching its limits. Nanoscale technologies are increasingly being explored as a practical solution to sustaining and possibly surpassing current performance trends of microelectronics. This work presents an in-depth...
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| Format: | Others |
| Language: | en_US |
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2010
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| Online Access: | http://hdl.handle.net/1969.1/ETD-TAMU-2666 http://hdl.handle.net/1969.1/ETD-TAMU-2666 |