Dynamic stability margin analysis on SRAM

In the past decade, aggressive scaling of transistor feature size has been a primary force driving higher Static Random Access Memory (SRAM) integration density. Due to the scaling, nanometer SRAM designs are getting more and more stability issues. The traditional way of analyzing stability is the S...

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Bibliographic Details
Main Author: Ho, Yenpo
Other Authors: Huang, Garng
Format: Others
Language:en_US
Published: 2010
Subjects:
Online Access:http://hdl.handle.net/1969.1/ETD-TAMU-2722
http://hdl.handle.net/1969.1/ETD-TAMU-2722