New tests and test methodologies for scan cell internal faults
Semiconductor industry goals for the quality of shipped products continue to get higher to satisfy customer requirements. Higher quality of shipped electronic devices can only be obtained by thorough tests of the manufactured components. Scan chains are universally used in large industrial designs i...
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| Format: | Others |
| Language: | English |
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University of Iowa
2009
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| Online Access: | https://ir.uiowa.edu/etd/452 https://ir.uiowa.edu/cgi/viewcontent.cgi?article=1637&context=etd |