Selectivity Failure in the Chemical Vapor Deposition of Tungsten

Tungsten metal is used as an electrical conductor in many modern microelectronic devices. One of the primary motivations for its use is that it can be deposited in thin films by chemical vapor deposition (CVD). CVD is a process whereby a thin film is deposited on a solid substrate by the reaction of...

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Bibliographic Details
Main Author: Cheek, Roger W. (Roger Warren)
Other Authors: Kelber, Jeffry Alan, 1952-
Format: Others
Language:English
Published: University of North Texas 1994
Subjects:
Online Access:https://digital.library.unt.edu/ark:/67531/metadc277954/