Electron-Ion Time-of-Flight Coincidence Measurements of K-K Electron Capture, Cross Sections for Nitrogen, Methane, Ethylene, Ethane, Carbon Dioxide and Argon (L-K) Targets

Protons with energies ranging from 0.4 to 2.0 MeV were used to measure K-shell vacancy production cross sections (oVK) for N_2, CH_4, C_2H_4, C_2H_6, and CO_2 gas targets under single collision conditions. An electron-ion time-of-flight coincidence technique was used to determind the ration of the K...

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Bibliographic Details
Main Author: Toten, Arvel D.
Other Authors: McDaniel, Floyd Del. (Floyd Delbert), 1942-
Format: Others
Language:English
Published: North Texas State University 1986
Subjects:
Online Access:https://digital.library.unt.edu/ark:/67531/metadc331079/