Study of Two Dimensional Materials by Scanning Probe Microscopy
This thesis explores structural and electronic properties of layered materials at the nanometre scale. Room temperature and low temperature ultrahigh vacuum scanning probe microscopy (scanning tunneling microscopy, scanning tunneling spectroscopy, atomic force microscopy) is used as the primary char...
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| Language: | en |
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Université d'Ottawa / University of Ottawa
2019
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| Online Access: | http://hdl.handle.net/10393/38637 http://dx.doi.org/10.20381/ruor-22889 |