Low-energy electron-induced DNA damage product analysis and mechanistic studies of damage in short oligonucleotides

The major objective of our group is to understand the mechanism of DNA damage induced by secondary low-energy electrons (LEE) arising from ionizing radiation and its relationship to radiosensitization and radiotherapy. Prof. Sanche has developed a novel low-energy electron irradiation system in whic...

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Bibliographic Details
Main Author: Li, Zejun
Other Authors: Sanche, Léon
Language:English
Published: Université de Sherbrooke 2010
Subjects:
Online Access:http://savoirs.usherbrooke.ca/handle/11143/4317