Modified Geffe test pattern generator for built-in self-test

Modified Geffe test pattern generator for built-in self-test

Unlike linear Finite State Machines (FSM) such as Linear Feedback Shift Registers (LFSR), the Geffe generator, a nonlinear FSM, hasn't been frequently studied or used in the scenario of digital system testing. Such machines are used as pattern generators for built-in self-test. LFSRs have becom...

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Bibliographic Details
Main Author: Qi, Dandan
Other Authors: Muzio, Jon C.
Language:English
en
Published: 2010
Subjects:
generators
computer programs
UVic Subject Index::Sciences and Engineering::Applied Sciences::Computer science
Online Access:http://hdl.handle.net/1828/2210

Internet

http://hdl.handle.net/1828/2210

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