A high-level language and CAD environment for BIST embedding
The reliable construction of VLSI integrated circuits (ICs) requires that the ICs be tested after fabrication. An alternative to performing external testing is to create ICs that can test themselves with a built-in self-test (BIST) mode. Unfortunately the problem of embedding a self-test operating m...
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| Format: | Others |
| Language: | English en |
| Published: |
2018
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| Online Access: | https://dspace.library.uvic.ca//handle/1828/9680 |