Absolute coverage measurements of ultrathin alkali-metal films on reconstructed silicon
Metal/semiconductor interfaces, particularly those involving Si, are of great technological and scientific interest. In atomically abrupt interfaces, many properties are determined by interatomic interactions over a few layers, i.e., over ~1 nanometer. The initial stages of growth of an atomic layer...
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| Format: | Others |
| Language: | en |
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2016
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| Online Access: | http://hdl.handle.net/10919/71500 |