Atomic Force Microscopy: Lateral-Force Calibration and Force-Curve Analysis
This thesis reflects two advances in atomic force microscopy. The first half is a new lateral force calibration procedure, which, in contrast to existing procedures, is independent of sample and cantilever shape, simple, direct, and quick. The second half is a high-throughput method for processing,...
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Digital WPI
2012
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| Online Access: | https://digitalcommons.wpi.edu/etd-theses/337 https://digitalcommons.wpi.edu/cgi/viewcontent.cgi?article=1336&context=etd-theses |