Atomic Force Microscopy: Lateral-Force Calibration and Force-Curve Analysis

This thesis reflects two advances in atomic force microscopy. The first half is a new lateral force calibration procedure, which, in contrast to existing procedures, is independent of sample and cantilever shape, simple, direct, and quick. The second half is a high-throughput method for processing,...

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Bibliographic Details
Main Author:	Anderson, Evan V
Other Authors:	Mingjiang Tao, Committee Member
Format:	Others
Published:	Digital WPI 2012
Subjects:	force curves calibration analysis curve fitting friction lateral force microscopy atomic force microscopy
Online Access:	https://digitalcommons.wpi.edu/etd-theses/337 https://digitalcommons.wpi.edu/cgi/viewcontent.cgi?article=1336&context=etd-theses

id	ndltd-wpi.edu-oai-digitalcommons.wpi.edu-etd-theses-1336
record_format	oai_dc
spelling	ndltd-wpi.edu-oai-digitalcommons.wpi.edu-etd-theses-13362019-03-22T05:45:46Z Atomic Force Microscopy: Lateral-Force Calibration and Force-Curve Analysis Anderson, Evan V This thesis reflects two advances in atomic force microscopy. The first half is a new lateral force calibration procedure, which, in contrast to existing procedures, is independent of sample and cantilever shape, simple, direct, and quick. The second half is a high-throughput method for processing, fitting, and analyzing force curves taken on Pseudomonas aeruginosa bacteria in an effort to inspire better care for statistics and increase measurement precision. 2012-04-26T07:00:00Z text application/pdf https://digitalcommons.wpi.edu/etd-theses/337 https://digitalcommons.wpi.edu/cgi/viewcontent.cgi?article=1336&context=etd-theses Masters Theses (All Theses, All Years) Digital WPI Mingjiang Tao, Committee Member Qi Wen, Committee Member Terri A. Camesano, Advisor Nancy A. Burnham, Advisor force curves calibration analysis curve fitting friction lateral force microscopy atomic force microscopy
collection	NDLTD
format	Others
sources	NDLTD
topic	force curves calibration analysis curve fitting friction lateral force microscopy atomic force microscopy
spellingShingle	force curves calibration analysis curve fitting friction lateral force microscopy atomic force microscopy Anderson, Evan V Atomic Force Microscopy: Lateral-Force Calibration and Force-Curve Analysis
description	This thesis reflects two advances in atomic force microscopy. The first half is a new lateral force calibration procedure, which, in contrast to existing procedures, is independent of sample and cantilever shape, simple, direct, and quick. The second half is a high-throughput method for processing, fitting, and analyzing force curves taken on Pseudomonas aeruginosa bacteria in an effort to inspire better care for statistics and increase measurement precision.
author2	Mingjiang Tao, Committee Member
author_facet	Mingjiang Tao, Committee Member Anderson, Evan V
author	Anderson, Evan V
author_sort	Anderson, Evan V
title	Atomic Force Microscopy: Lateral-Force Calibration and Force-Curve Analysis
title_short	Atomic Force Microscopy: Lateral-Force Calibration and Force-Curve Analysis
title_full	Atomic Force Microscopy: Lateral-Force Calibration and Force-Curve Analysis
title_fullStr	Atomic Force Microscopy: Lateral-Force Calibration and Force-Curve Analysis
title_full_unstemmed	Atomic Force Microscopy: Lateral-Force Calibration and Force-Curve Analysis
title_sort	atomic force microscopy: lateral-force calibration and force-curve analysis
publisher	Digital WPI
publishDate	2012
url	https://digitalcommons.wpi.edu/etd-theses/337 https://digitalcommons.wpi.edu/cgi/viewcontent.cgi?article=1336&context=etd-theses
work_keys_str_mv	AT andersonevanv atomicforcemicroscopylateralforcecalibrationandforcecurveanalysis
_version_	1719005689226985472

Atomic Force Microscopy: Lateral-Force Calibration and Force-Curve Analysis

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