Atomic Force Microscopy: Lateral-Force Calibration and Force-Curve Analysis
This thesis reflects two advances in atomic force microscopy. The first half is a new lateral force calibration procedure, which, in contrast to existing procedures, is independent of sample and cantilever shape, simple, direct, and quick. The second half is a high-throughput method for processing,...
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ndltd-wpi.edu-oai-digitalcommons.wpi.edu-etd-theses-13362019-03-22T05:45:46Z Atomic Force Microscopy: Lateral-Force Calibration and Force-Curve Analysis Anderson, Evan V This thesis reflects two advances in atomic force microscopy. The first half is a new lateral force calibration procedure, which, in contrast to existing procedures, is independent of sample and cantilever shape, simple, direct, and quick. The second half is a high-throughput method for processing, fitting, and analyzing force curves taken on Pseudomonas aeruginosa bacteria in an effort to inspire better care for statistics and increase measurement precision. 2012-04-26T07:00:00Z text application/pdf https://digitalcommons.wpi.edu/etd-theses/337 https://digitalcommons.wpi.edu/cgi/viewcontent.cgi?article=1336&context=etd-theses Masters Theses (All Theses, All Years) Digital WPI Mingjiang Tao, Committee Member Qi Wen, Committee Member Terri A. Camesano, Advisor Nancy A. Burnham, Advisor force curves calibration analysis curve fitting friction lateral force microscopy atomic force microscopy |
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force curves calibration analysis curve fitting friction lateral force microscopy atomic force microscopy |
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force curves calibration analysis curve fitting friction lateral force microscopy atomic force microscopy Anderson, Evan V Atomic Force Microscopy: Lateral-Force Calibration and Force-Curve Analysis |
description |
This thesis reflects two advances in atomic force microscopy. The first half is a new lateral force calibration procedure, which, in contrast to existing procedures, is independent of sample and cantilever shape, simple, direct, and quick. The second half is a high-throughput method for processing, fitting, and analyzing force curves taken on Pseudomonas aeruginosa bacteria in an effort to inspire better care for statistics and increase measurement precision. |
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Mingjiang Tao, Committee Member |
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Mingjiang Tao, Committee Member Anderson, Evan V |
author |
Anderson, Evan V |
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Anderson, Evan V |
title |
Atomic Force Microscopy: Lateral-Force Calibration and Force-Curve Analysis |
title_short |
Atomic Force Microscopy: Lateral-Force Calibration and Force-Curve Analysis |
title_full |
Atomic Force Microscopy: Lateral-Force Calibration and Force-Curve Analysis |
title_fullStr |
Atomic Force Microscopy: Lateral-Force Calibration and Force-Curve Analysis |
title_full_unstemmed |
Atomic Force Microscopy: Lateral-Force Calibration and Force-Curve Analysis |
title_sort |
atomic force microscopy: lateral-force calibration and force-curve analysis |
publisher |
Digital WPI |
publishDate |
2012 |
url |
https://digitalcommons.wpi.edu/etd-theses/337 https://digitalcommons.wpi.edu/cgi/viewcontent.cgi?article=1336&context=etd-theses |
work_keys_str_mv |
AT andersonevanv atomicforcemicroscopylateralforcecalibrationandforcecurveanalysis |
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1719005689226985472 |