Fast and High-Fidelity State Preparation and Measurement in Triple-Quantum-Dot Spin Qubits

Fast and High-Fidelity State Preparation and Measurement in Triple-Quantum-Dot Spin Qubits

We demonstrate rapid high-fidelity state preparation and measurement in exchange-only Si/SiGe triple-quantum-dot qubits. Fast measurement integration (980-ns) and initialization (approximately 300-ns) operations are performed with all-electrical baseband control. We emphasize a leakage-sensitive joi...

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Bibliographic Details
Main Authors: Andrews, R.W (Author), Barnes, D.W (Author), Blumoff, J.Z (Author), Borselli, M.G (Author), Brecht, T.L (Author), Croke, E.T (Author), Eng, K. (Author), Euliss, L.E (Author), Fast, J.A (Author), Hunter, A.T (Author), Jackson, C.A.C (Author), Jones, A.M (Author), Keating, T.E (Author), Kerckhoff, J. (Author), Ladd, T.D (Author), Lanza, R.K (Author), Pan, A.S (Author), Raach, K. (Author), Rakher, M.T (Author), Thomas, B.J (Author), Velunta, R. (Author), Weinstein, A.J (Author)
Format: Article
Language:English
Published: American Physical Society 2022
Subjects:
Fast measurement
High-fidelity
Measurement integration
Nanocrystals
Quantum dot qubits
Quantum dot spins
Quantum optics
Qubits
Semiconductor quantum dots
Si/SiGe
Spin qubit
State measurements
State preparation
Triple quantum
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