Microscale deformation mechanisms in paperboard during continuous tensile loading and 4D synchrotron X-ray tomography

A better physical understanding of mesoscale and microscale mechanisms behind deformation and failure of paperboard material is important to optimize industrial packaging converting processes and decrease waste. In this study, these mechanisms were investigated using synchrotron X-ray tomography dur...

Full description

Bibliographic Details
Main Authors: Engqvist, J. (Author), Hall, S.A (Author), Johansson, S. (Author), Tryding, J. (Author)
Format: Article
Language:English
Published: John Wiley and Sons Inc 2022
Subjects:
Online Access:View Fulltext in Publisher