Surface Recombination and Space-Charge-Limited Photocurrent-Voltage (PC-V) Measurements in (Cd,Mn)Te Samples–Kinetics of Photocurrent (PC)

Surface Recombination and Space-Charge-Limited Photocurrent-Voltage (PC-V) Measurements in (Cd,Mn)Te Samples–Kinetics of Photocurrent (PC)

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Photocurrent-voltage characteristic (PC-V) is a method of determining the critical parameter in X-ray and gamma-ray detector plates, i.e., the carrier mobility-lifetime product, µτ. We show for the (Cd,Mn)Te samples that the measurement results depend strongly on the surface treatment and the space...

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Bibliographic Details
Main Authors: Czarnacki, W. (Author), Dobrowolski, W. (Author), Górska, M. (Author), Gościński, K. (Author), Iwanowska-Hanke, J. (Author), Janiak, Ł. (Author), Janusz, G. (Author), Kochanowska, D.M (Author), Moszyński, M. (Author), Mycielski, A. (Author), Świderski, Ł. (Author), Szot, M. (Author), Wardak, A. (Author)
Format: Article
Language:English
Published: MDPI 2022
Subjects:
Carrier mobility
carrier mobility-lifetime product
Carrier mobility-lifetime product
CdMnTe
Chlorine compounds
etching
Etching
Gamma rays
Manganese compounds
Measurements of
Mobility-lifetime products
Plate surfaces
Sample surface
Space-charge distribution
Space-charge limited photocurrents
surface defects
Surface defects
Surface recombinations
Surface trap
Tellurium
Tellurium compounds
Voltage characteristics
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