Surface Topology and Optical Properties of Nanostructured Zinc Oxide Thin Films Prepared Using Two-Stage Solution Immersion Method

Surface Topology and Optical Properties of Nanostructured Zinc Oxide Thin Films Prepared Using Two-Stage Solution Immersion Method

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Nanostructured zinc oxide (ZnO) films were prepared using two-stage immersion process. The properties of the prepared films were investigated using atomic force microscopy and ultraviolet-visible spectroscopy. The root-mean-square surface roughness of the nanostructured ZnO film was 79 nm. The avera...

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Bibliographic Details
Main Authors: Ahmad, W.R.W (Author), Ismail, A.S (Author), Khusaimi, Z. (Author), Malek, M.F (Author), Mamat, M.H (Author), Rusop, M. (Author), Saidi, S.A (Author), Sin, N.D.M (Author), Yusoff, M.M (Author), Zoolfakar, A.S (Author)
Format: Article
Language:English
Published: Institute of Physics Publishing 2018
Subjects:
Atomic force microscopy
Electronic equipment
Film preparation
II-VI semiconductors
Immersion method
Immersion process
Metallic films
Nanostructured zinc oxides
Nanostructured ZnO
Optical films
Optical properties
Oxide films
Root Mean Square
Surface roughness
Surface topology
Thermoelectric equipment
Thin films
Ultraviolet absorbance
Ultraviolet visible spectroscopy
Visible spectra
Zinc oxide
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