Surface Topology and Optical Properties of Nanostructured Zinc Oxide Thin Films Prepared Using Two-Stage Solution Immersion Method

• Main Authors: Ahmad, W.R.W (Author), Ismail, A.S (Author), Khusaimi, Z. (Author), Malek, M.F (Author), Mamat, M.H (Author), Rusop, M. (Author), Saidi, S.A (Author), Sin, N.D.M (Author), Yusoff, M.M (Author), Zoolfakar, A.S (Author)
• Format: Article
• Language: English
• Published: Institute of Physics Publishing 2018
• Subjects: Atomic force microscopy; Electronic equipment; Film preparation; II-VI semiconductors; Immersion method; Immersion process; Metallic films; Nanostructured zinc oxides; Nanostructured ZnO; Optical films; Optical properties; Oxide films; Root Mean Square; Surface roughness; Surface topology; Thermoelectric equipment; Thin films; Ultraviolet absorbance; Ultraviolet visible spectroscopy; Visible spectra; Zinc oxide
• Online Access: View Fulltext in Publisher; View in Scopus
• ISBN: 17578981 (ISSN)
• DOI: 10.1088/1757-899X/340/1/012011

Nanostructured zinc oxide (ZnO) films were prepared using two-stage immersion process. The properties of the prepared films were investigated using atomic force microscopy and ultraviolet-visible spectroscopy. The root-mean-square surface roughness of the nanostructured ZnO film was 79 nm. The average optical transmittance of the film was 72% in the visible spectrum. The prepared nanostructured ZnO film also has high ultraviolet absorbance. © Published under licence by IOP Publishing Ltd.