A method for finding the background potential of quantum devices from scanning gate microscopy data using machine learning
The inverse problem of estimating the background potential from measurements of the local density of states is a challenging issue in quantum mechanics. Even more difficult is to do this estimation using approximate methods such as scanning gate microscopy (SGM). Here, we propose a machine-learning-...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Institute of Physics
2022
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| Subjects: | |
| Online Access: | View Fulltext in Publisher |