Mean Estimation from One-Bit Measurements
We consider the problem of estimating the mean of a symmetric log-concave distribution under the constraint that only a single bit per sample from this distribution is available to the estimator. We study the mean squared error as a function of the sample size (and hence the number of bits). We cons...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Institute of Electrical and Electronics Engineers Inc.
2022
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| Subjects: | |
| Online Access: | View Fulltext in Publisher |