High-resolution 3D shape measurement with extended depth of field using fast chromatic focus stacking
Close-range 3D sensors based on the structured light principle have a constrained measuring range due to their depth of field (DOF). Focus stacking is a method to extend the DOF. The additional time to change the focus is a drawback in high-speed measurements. In our research, the method of chromati...
| Main Authors: | , , , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Optica Publishing Group (formerly OSA)
2022
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| Online Access: | View Fulltext in Publisher |