Saturated-excitation image scanning microscopy

Saturated-excitation image scanning microscopy

Image scanning microscopy (ISM) overcomes the trade-off between spatial resolution and signal volume in confocal microscopy by rearranging the signal distribution on a two-dimensional detector array to achieve a spatial resolution close to the theoretical limit achievable by infinitesimal pinhole de...

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Bibliographic Details
Main Authors: Fujita, K. (Author), Heintzmann, R. (Author), Kubo, T. (Author), Lachmann, R. (Author), Oketani, R. (Author), Smith, N.I (Author), Temma, K. (Author)
Format: Article
Language:English
Published: Optica Publishing Group (formerly OSA) 2022
Subjects:
Detector arrays
Economic and social effects
Fluorescence imaging
Image resolution
Image scanning
Scanning microscopy
Signal detection
Signal distribution
Spatial resolution
Spatial signals
Theoretical limits
Three dimensions
Trade off
Two-dimensional detectors
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