Subsurface damage layer of bulk single-crystal potassium dihydrogen phosphate (KDP) after SPDT: studied by the grazing incidence X-ray diffraction technique

Subsurface damage layer of bulk single-crystal potassium dihydrogen phosphate (KDP) after SPDT: studied by the grazing incidence X-ray diffraction technique

This work proposes a novel way of the subsurface damage layer characterization for bulk single-crystal optical material, based on the X-ray grazing incidence technique (GIXRD). The result shows that the subsurface damage layer of bulk single-crystal potassium dihydrogen phosphate (KDP) mainly consis...

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Bibliographic Details
Main Authors: Fan, Q.C (Author), Gao, W. (Author), Ji, F. (Author), Wang, C. (Author), Zhang, Y. (Author)
Format: Article
Language:English
Published: Optica Publishing Group (formerly OSA) 2022
Subjects:
Bulk single crystals
Grazing incidence X-ray diffraction
Grazing-incidence X-ray diffraction
Layer characterization
Material-based
Polycrystalline
Polycrystalline textures
Potassium compounds
Single crystals
Single point diamond turning
Sub-surface damage
Textures
X ray diffraction
X-ray diffraction techniques
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