An experimental evaluation of fault diagnosis from imbalanced and incomplete data for smart semiconductor manufacturing
The SECOM dataset contains information about a semiconductor production line, entailing the products that failed the in-house test line and their attributes. This dataset, similar to most semiconductor manufacturing data, contains missing values, imbalanced classes, and noisy features. In this work,...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2018
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| Subjects: | |
| Online Access: | View Fulltext in Publisher |