Intrinsic Properties and Future Perspective of HfO2/V2O5/HfO2 Multi-Layer Thin Films via E-Beam Evaporation as a Transparent Heat Mirror

Intrinsic Properties and Future Perspective of HfO2/V2O5/HfO2 Multi-Layer Thin Films via E-Beam Evaporation as a Transparent Heat Mirror

HfO2 and V2O5 as multi-layer thin films are discussed for their potential use as transparent heat mirrors. Multi-layered HfO2/V2O5/HfO2 thin films with a thickness of 100/60/100 nm were pre-pared via e-beam evaporation on a soda–lime glass substrate. Rutherford backscattering confirmed the multi-lay...

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Bibliographic Details
Main Authors: Alghamdi, A.S (Author), Cheema, D.A (Author), Danial, M.O (Author), Hanif, M.B (Author), Khaliq, A. (Author), Khan, A.F (Author), Motola, M. (Author), Ramadan, M. (Author), Subhani, T. (Author)
Format: Article
Language:English
Published: MDPI 2022
Subjects:
HfO2
multi-layer
thin films
transparent heat mirror
V2O5
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