Use of PtC Nanotips for Low-Voltage Quantum Tunneling Applications

Use of PtC Nanotips for Low-Voltage Quantum Tunneling Applications

The use of focused ion and focused electron beam (FIB/FEB) technology permits the fabrication of micro-and nanometer scale geometries. Therefore, FIB/FEB technology is a favorable technique for preparing TEM lamellae, nanocontacts, or nanowires and repairing electronic circuits. This work investigat...

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Bibliographic Details
Main Authors: Bogner, M. (Author), Guenther, T. (Author), Haub, M. (Author), Zimmermann, A. (Author)
Format: Article
Language:English
Published: MDPI 2022
Subjects:
Cyclic voltammetry
DLC
EDX
Energy dispersive spectroscopy
Energy dispersive X ray spectroscopy
Energy gap
FEB
FIB
focused electron beam
Focused electron beams
focused ion beam
Focused ion beams
Focused ions beams
Platinum
platinum carbon
Pyrolytic graphite
quantum tunneling
Quantum tunneling
Resistance measurement
scanning tunneling microscopy
Scanning tunneling microscopy
Scanning tunnelling microscopes
Tunneling voltages
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