A Fast Loss Model for Cascode GaN-FETs and Real-Time Degradation-Sensitive Control of Solid-State Transformers

This paper proposes a novel, degradation-sensitive, adaptive SST controller for cascode GaN-FETs. Unlike in traditional transformers, a semiconductor switch’s degradation and failure can compromise its robustness and integrity. It is vital to continuously monitor a switch’s health condition to adapt...

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Bibliographic Details
Main Authors: Baek, J. (Author), Choi, S. (Author), Haque, M.S (Author), Kwak, S. (Author), Moniruzzaman, M. (Author), Okilly, A.H (Author)
Format: Article
Language:English
Published: MDPI 2023
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