Scan architecture with mutually exclusive scan segment activation for shift and capture power reduction
Power dissipation during scan testing is becoming an important concern as design sizes and gate densities increase. While several approaches have been recently proposed for reducing power dissipation during the shift cycle (minimum transition don't care fill, special scan cells and scan chain p...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
2004-07.
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| Subjects: | |
| Online Access: | Get fulltext |