Effect of fluorine on boron diffusion under interstitial injection from the surface
In this paper, a point defect injection study is performed to investigate the effect of fluorine on boron diffusion when interstitials are injected from the surface. 185keV, 2.3x1015 cm-2 fluorine is implanted into silicon with a boron marker layer located at about Rp/2 of the fluorine implant. This...
Main Authors: | Kham, M.N (Author), El Mubarek, H.A.W (Author), Bonar, J.M (Author), Chivers, D. (Author), Ashburn, P. (Author) |
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Format: | Article |
Language: | English |
Published: |
2006-12.
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Subjects: | |
Online Access: | Get fulltext |
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