High quality Schottky contacts for limiting leakage currents in Ge-based Schottky barrier MOSFETs

Schottky barrier (SB) Ge channel MOSFETs suffer from high drain-body leakage at the required elevated substrate doping concentrations to suppress source-drain leakage. Here we show that electrodeposited Ni-Ge and NiGe/Ge Schottky diodes on highly doped Ge show low off current, which might make them...

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Bibliographic Details
Main Authors: Husain, M.K (Author), Li, X. (Author), de Groot, C.H (Author)
Format: Article
Language:English
Published: 2009-03.
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