Reliable state retention-based embedded processors through monitoring and recovery
State retention power gating and voltage-scaled state retention are two effective design techniques, commonly employed in embedded processors, for reducing idle circuit leakage power. This paper presents a methodology for improving the reliability of embedded processors in the presence of power supp...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
2011-08-24.
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| Subjects: | |
| Online Access: | Get fulltext |