Reliable state retention-based embedded processors through monitoring and recovery
State retention power gating and voltage-scaled state retention are two effective design techniques, commonly employed in embedded processors, for reducing idle circuit leakage power. This paper presents a methodology for improving the reliability of embedded processors in the presence of power supp...
Main Authors: | Yang, Sheng (Author), Khursheed, Syed Saqib (Author), Al-Hashimi, Bashir (Author), Flynn, David (Author), Idgunji, Sachin (Author) |
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Format: | Article |
Language: | English |
Published: |
2011-08-24.
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Subjects: | |
Online Access: | Get fulltext |
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