A multi-voltage aware resistive open fault model
Resistive open faults (ROFs) represent common interconnect manufacturing defects in VLSI designs {causing delay failures and reliability-related concerns}. The widespread utilization of multiple supply voltages in contemporary VLSI designs and {emerging test methods} poses a critical concern as to w...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
2014-02.
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| Subjects: | |
| Online Access: | Get fulltext |